Research Article

Study of Various Faults on Physical level using Microwind2

by  Monika Barhane, Puran Gaur, Rajiv Thakur
journal cover
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 77 - Issue 9
Published: September 2013
Authors: Monika Barhane, Puran Gaur, Rajiv Thakur
10.5120/13421-1099
PDF

Monika Barhane, Puran Gaur, Rajiv Thakur . Study of Various Faults on Physical level using Microwind2. International Journal of Computer Applications. 77, 9 (September 2013), 14-19. DOI=10.5120/13421-1099

                        @article{ 10.5120/13421-1099,
                        author  = { Monika Barhane,Puran Gaur,Rajiv Thakur },
                        title   = { Study of Various Faults on Physical level using Microwind2 },
                        journal = { International Journal of Computer Applications },
                        year    = { 2013 },
                        volume  = { 77 },
                        number  = { 9 },
                        pages   = { 14-19 },
                        doi     = { 10.5120/13421-1099 },
                        publisher = { Foundation of Computer Science (FCS), NY, USA }
                        }
                        %0 Journal Article
                        %D 2013
                        %A Monika Barhane
                        %A Puran Gaur
                        %A Rajiv Thakur
                        %T Study of Various Faults on Physical level using Microwind2%T 
                        %J International Journal of Computer Applications
                        %V 77
                        %N 9
                        %P 14-19
                        %R 10.5120/13421-1099
                        %I Foundation of Computer Science (FCS), NY, USA
Abstract

In this contribution, we present microwind2 based fault simulation environment. Many faults may occur on the circuit level as well as physical level. To fulfill our goal, the layout design of BCD to Excess-3 code converter is taken and the effect of various faults such as latchup, distribution of RC effect, input waveform slope and bridging fault are seen. The effect of these faults are examined on the various foundries of cmos: 0. 12 m, 0. 18 m, 0. 25 m and 0. 8 m. Experimental and simulation results show the effect of faults on layout design.

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Index Terms
Computer Science
Information Sciences
No index terms available.
Keywords

DSCH2 microwind2 latchup fault input waveform slope RC effect bridging fault.

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