Research Article

Studies on the Growth and Microhardness, Dielectrics and Photoconductivity of NLO Material Ammonium acid phthalate

by  Suresh Sagadevan, R. Varatharajan
journal cover
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 75 - Issue 5
Published: August 2013
Authors: Suresh Sagadevan, R. Varatharajan
10.5120/13108-0427
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Suresh Sagadevan, R. Varatharajan . Studies on the Growth and Microhardness, Dielectrics and Photoconductivity of NLO Material Ammonium acid phthalate. International Journal of Computer Applications. 75, 5 (August 2013), 28-32. DOI=10.5120/13108-0427

                        @article{ 10.5120/13108-0427,
                        author  = { Suresh Sagadevan,R. Varatharajan },
                        title   = { Studies on the Growth and Microhardness, Dielectrics and Photoconductivity of NLO Material Ammonium acid phthalate },
                        journal = { International Journal of Computer Applications },
                        year    = { 2013 },
                        volume  = { 75 },
                        number  = { 5 },
                        pages   = { 28-32 },
                        doi     = { 10.5120/13108-0427 },
                        publisher = { Foundation of Computer Science (FCS), NY, USA }
                        }
                        %0 Journal Article
                        %D 2013
                        %A Suresh Sagadevan
                        %A R. Varatharajan
                        %T Studies on the Growth and Microhardness, Dielectrics and Photoconductivity of NLO Material Ammonium acid phthalate%T 
                        %J International Journal of Computer Applications
                        %V 75
                        %N 5
                        %P 28-32
                        %R 10.5120/13108-0427
                        %I Foundation of Computer Science (FCS), NY, USA
Abstract

Single crystals of Ammonium acid phthalate have been grown using the slow evaporation technique. A single crystal of good quality was harvested in a period of 30 days. Different characterization studies were carried out for finding its suitability in device fabrications. The lattice parameters were found from single crystal X-ray diffraction analysis. The grown crystal crystallized under orthorhombic system with Pcab space group. The Vicker's microhardness studies were performed to understand the mechanical behavior of crystals. The dielectric studies were carried on the grown crystals to study the electric behavior of these crystals. Photoconductivity measurements carried out on the grown crystal reveal the negative photoconducting nature

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Index Terms
Computer Science
Information Sciences
No index terms available.
Keywords

Single X-ray diffraction Vickers microhardness Non-linear optical materials Dielectric constant Dielectric loss and Photoconductivity studies

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