International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
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Volume 64 - Issue 11 |
Published: February 2013 |
Authors: M. Elemam Shehab, K. Badran, Gouda I. Salama |
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M. Elemam Shehab, K. Badran, Gouda I. Salama . A Generic Feature Extraction Model using Learnable Evolution Models (LEM+ID3). International Journal of Computer Applications. 64, 11 (February 2013), 27-32. DOI=10.5120/10680-5562
@article{ 10.5120/10680-5562, author = { M. Elemam Shehab,K. Badran,Gouda I. Salama }, title = { A Generic Feature Extraction Model using Learnable Evolution Models (LEM+ID3) }, journal = { International Journal of Computer Applications }, year = { 2013 }, volume = { 64 }, number = { 11 }, pages = { 27-32 }, doi = { 10.5120/10680-5562 }, publisher = { Foundation of Computer Science (FCS), NY, USA } }
%0 Journal Article %D 2013 %A M. Elemam Shehab %A K. Badran %A Gouda I. Salama %T A Generic Feature Extraction Model using Learnable Evolution Models (LEM+ID3)%T %J International Journal of Computer Applications %V 64 %N 11 %P 27-32 %R 10.5120/10680-5562 %I Foundation of Computer Science (FCS), NY, USA
Inspired originally by the Learnable Evolution Model(LEM) a new presents of new classification algorithm called (LEM+ID3), which is based on the techniques from the learnable evolution models (LEM) to enhance convergence and accuracy of the algorithm and use of ID3 in order to construct the tree used in classification. In this paper a new version of LEM which convert LEM from optimization domain to classification domain and then examine the feature extraction problems and show that learning evolutional can significantly enhance the performance of pattern recognition systems with simple classifiers. This model is applied to real world datasets from the UCI Machine Learning databases to verify proposed approach and compare it with other convention classifiers. The conclusion is this algorithm is able to produce classifiers of superior (or equivalent) performance to the conventional classifiers examined Also time taken to reach near optimum accuracy.