International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
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Volume 48 - Issue 11 |
Published: June 2012 |
Authors: Ganesh L K M, Kavita Khare, Priyanka Sharma |
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Ganesh L K M, Kavita Khare, Priyanka Sharma . Application of Analog IC Testing Circuit. International Journal of Computer Applications. 48, 11 (June 2012), 1-3. DOI=10.5120/7389-0222
@article{ 10.5120/7389-0222, author = { Ganesh L K M,Kavita Khare,Priyanka Sharma }, title = { Application of Analog IC Testing Circuit }, journal = { International Journal of Computer Applications }, year = { 2012 }, volume = { 48 }, number = { 11 }, pages = { 1-3 }, doi = { 10.5120/7389-0222 }, publisher = { Foundation of Computer Science (FCS), NY, USA } }
%0 Journal Article %D 2012 %A Ganesh L K M %A Kavita Khare %A Priyanka Sharma %T Application of Analog IC Testing Circuit%T %J International Journal of Computer Applications %V 48 %N 11 %P 1-3 %R 10.5120/7389-0222 %I Foundation of Computer Science (FCS), NY, USA
This paper presents application of Neural classifier with High pass filter(HPF) to examine its own functional health, to speed up test time and to facilitate fault diagnosis Here we presents an application to insert a built in test block to test any complicated analog circuit in terms of performance while considering tolerance factor. Testing block which is to be added in the chip contains Synapse, Common mode canceller and current to voltage converter along with that a simple operational High pass filter ( HPF ) is taken as a CUT.