Research Article

Application of Analog IC Testing Circuit

by  Ganesh L K M, Kavita Khare, Priyanka Sharma
journal cover
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 48 - Issue 11
Published: June 2012
Authors: Ganesh L K M, Kavita Khare, Priyanka Sharma
10.5120/7389-0222
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Ganesh L K M, Kavita Khare, Priyanka Sharma . Application of Analog IC Testing Circuit. International Journal of Computer Applications. 48, 11 (June 2012), 1-3. DOI=10.5120/7389-0222

                        @article{ 10.5120/7389-0222,
                        author  = { Ganesh L K M,Kavita Khare,Priyanka Sharma },
                        title   = { Application of Analog IC Testing Circuit },
                        journal = { International Journal of Computer Applications },
                        year    = { 2012 },
                        volume  = { 48 },
                        number  = { 11 },
                        pages   = { 1-3 },
                        doi     = { 10.5120/7389-0222 },
                        publisher = { Foundation of Computer Science (FCS), NY, USA }
                        }
                        %0 Journal Article
                        %D 2012
                        %A Ganesh L K M
                        %A Kavita Khare
                        %A Priyanka Sharma
                        %T Application of Analog IC Testing Circuit%T 
                        %J International Journal of Computer Applications
                        %V 48
                        %N 11
                        %P 1-3
                        %R 10.5120/7389-0222
                        %I Foundation of Computer Science (FCS), NY, USA
Abstract

This paper presents application of Neural classifier with High pass filter(HPF) to examine its own functional health, to speed up test time and to facilitate fault diagnosis Here we presents an application to insert a built in test block to test any complicated analog circuit in terms of performance while considering tolerance factor. Testing block which is to be added in the chip contains Synapse, Common mode canceller and current to voltage converter along with that a simple operational High pass filter ( HPF ) is taken as a CUT.

References
  • Dzmitry Maliuk , Haralampos-G. Stratigopoulos and Yiorgos Makris" An Analog VLSI Multilayer Perceptron and its Application Towards Built-In Self-Test in Analog Circuits" 2010 IEEE 16th International On-Line Testing Symposium, pp. 71-76, 2010.
  • V. F. Koosh and R. M. Goodmanr, "Analog VLSI neural network with digital perturbative learning," IEEE Transactions on Circuits and Systems - II, vol. 49, no. 5, pp. 359–368, 2002.
  • Behzad Razavi, "Design of Analog CMOS Integrated Circuits" published by McGraw-Hill,2001,pp. 104-105,2001
Index Terms
Computer Science
Information Sciences
No index terms available.
Keywords

Synapse Neuron Neural Classifier And Common Mode Canceller

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