Research Article
A Review Paper on Semiconductors using Big Data
|
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
|
| Volume 179 - Issue 35 |
| Published: Apr 2018 |
| Authors: Yash Shukla |
10.5120/ijca2018916802
|
Yash Shukla . A Review Paper on Semiconductors using Big Data. International Journal of Computer Applications. 179, 35 (Apr 2018), 42-43. DOI=10.5120/ijca2018916802
@article{ 10.5120/ijca2018916802,
author = { Yash Shukla },
title = { A Review Paper on Semiconductors using Big Data },
journal = { International Journal of Computer Applications },
year = { 2018 },
volume = { 179 },
number = { 35 },
pages = { 42-43 },
doi = { 10.5120/ijca2018916802 },
publisher = { Foundation of Computer Science (FCS), NY, USA }
}
%0 Journal Article
%D 2018
%A Yash Shukla
%T A Review Paper on Semiconductors using Big Data%T
%J International Journal of Computer Applications
%V 179
%N 35
%P 42-43
%R 10.5120/ijca2018916802
%I Foundation of Computer Science (FCS), NY, USA
Abstract
In the Digital world there is arrival of new type of modifications. Semiconductors faced much kind of new difficulties through which the data management is very much complicated. Here “Big data” is applied to the system which results in the flexibility and speed of the manufacturing of the process. Big data will overtake the critical risk and provide friendly platform systems which are useful for the construction of the semi-conductors. To manufacture a good and stabilized semiconductor a well type of Fault Detection and Classification (FDC) has been required using big data.
References
- Advanced semiconductor Manufacturing using Big data.(2015) Tomio Tsuda, Shinji Inoue
- Big data applied to Semiconductor Manufacturing Advanced Process Control.(2016) James Moyne, Jamini Samantaray.
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